JAI is expanding its SWIR imaging portfolio with the introduction of the new Wave Series line scan cameras – the WAL-1001-GE and WAL-2001-GE. Designed for demanding industrial machine vision applications, the new models combine advanced InGaAs sensor technology with high-speed line scan imaging to reveal details beyond the visible spectrum.
Short-Wave Infrared (SWIR) imaging is increasingly used in machine vision for inspection, measurement, and monitoring applications where standard visible-light imaging is unable to provide sufficient contrast or material differentiation. By extending imaging sensitivity beyond the visible spectrum, SWIR technology enables detection of moisture variations, hidden defects, material differences, contamination, and structural inconsistencies that would otherwise remain invisible.
The new WAL models are designed specifically to address these challenges in industries such as semiconductor inspection, food inspection, battery production, web inspection, and material analysis.
The Wave Series includes two new line scan models:
- WAL-1001-GE – 1K resolution (1024 pixels)
- WAL-2001-GE – 2K resolution (2048 pixels)
The cameras offer maximum line rates of up to 20 kHz and 40 kHz respectively, enabling reliable high-speed inspection in continuous production environments.
Both models feature advanced InGaAs image sensors with large 12.5 μm square pixels. The large pixel design improves light collection in low-light conditions and contributes to a higher signal-to-noise ratio, resulting in cleaner images with reduced noise and improved contrast. This is especially beneficial in challenging SWIR inspection environments where precise differentiation between materials or defects is critical.
In addition to 8-, 10-, and 12-bit outputs, the cameras also support 14-bit video output, providing up to 16,384 grayscale levels for enhanced detection accuracy and improved visualization of subtle material differences and moisture variations.
The unique 2K sensor setup additionally allows the use of compact C-mount lenses for both camera models, helping simplify system integration while reducing optical complexity and system size.
With the launch of the WAL-1001-GE and WAL-2001-GE, JAI continues to expand its advanced imaging portfolio with technologies designed to help manufacturers improve inspection reliability, process efficiency, and product quality.
